Atom Probe Tomography

  Facility Details  

Make : CAMECA
Model : LEAP 5000XR
Installed in : Jun 2017 at IIT Madras
Specification :
  Reflectron ion optic design
  Field of view up to 200 nm
  Voltage and Laser modes
  Mass resolving power 1100
  Specimen temperature 25K to 80K
  355 nm UV laser for laser mode
  Laser energy range from 0.001pJ to 1000pJ
  Less than 3 micro meter laser spot size
  Up to 500kHz pulse rate for laser

   About NFAPT   

         IIT Madras has established the National Facility for Atom Probe Tomography (NFAPT) which houses a state of art atom probe tomography "Local Electrode Atom Probe (LEAP 5000 XR)" along with "Helios Dual Beam Scanning Electron Microscope with Focussed Ion Beam (FIB)" for LEAP sample preparation. IIT Bombay, as a founding partner institute, has a remote terminal for the operation of the instrument and software for the analysis of the data after data acquisition.
This is the first remotely operable LEAP facility in the world. Any researcher in India can use the facility by contacting the NFAPT management. More details can be found on https://nfapt.iitm.ac.in IIT Bombay users should submit the proposals for measurement to the Facility Management Committee chaired by head of SAIF/CRNTS as given below.


   Introduction   

         About National Facility for Atom Probe Tomography (NFAPT) Atom probe tomography (APT) exhibits unique advantages and capabilities such as atomic resolution (lateral resolution : 0 . 3 - 0 . 5 nm and depth resolution 0 . 1 - 0 . 3 nm) , 3 D information about the position of the each atom in the analysed sample and chemical sensitivity down to atomic parts per million . The laser assisted LEAP 5000 XR extends the advantages to characterize range of materials with improved detection sensitivity and efficiency making this as a versatile atom probe . LEAP 5000 XR Focused Ion beam facility Introduction to Atom Probe Tomography APT sample preparation using FIB.


Click here for Research Proposal format for LEAP

  Applications   

Qualitative Analysis & Quantitative Analysis

     Grain boundary analysis in metals.
     Interface analysis in magnetostrictive materials.
     Investigation of phase change separation processes.
     Atomic scale characterization of dopants.
     Characterization of advanced alloys.
     Thin film characterization.
     Oxide growth in metal.
  Location

     National Facility for Atom Probe Tomography (NFAPT)
     HSB-134, Indian Institute of Technology Madras,
     Chennai-600036,India
     Hardware and Software for remote access and
     analysis
located at:

     Room No.414, 1st Floor,
     Dept: SAIF,IIT Bombay.


  Convener   
     Head, CRNTS/SAIF IIT Bombay
      Contact : 022-25767690
      Email Id : head.crnts@iitb.ac.in

  Technical Staff   
     Mr. Amit Vitthal Kumbhar
      Contact : 022-2159 6864
      Email Id : aptlab@iitb.ac.in, amitkumbhar@iitb.ac.in


 APT charges 

IIT Bombay Users
APT Analysis 5000/-Per Sample