Qualitative Analysis & Quantitative Analysis
Grain boundary analysis in metals.
Interface analysis in magnetostrictive materials.
Investigation of phase change separation processes.
Atomic scale characterization of dopants.
Characterization of advanced alloys.
Thin film characterization.
Oxide growth in metal.
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National Facility for Atom Probe Tomography (NFAPT)
HSB-134, Indian Institute of Technology Madras,
Chennai-600036,India
Hardware and Software for remote access and analysis located at:
Room No.414, 1st Floor,
Dept: SAIF,IIT Bombay.
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Head, CRNTS/SAIF IIT Bombay
Contact : 022-25767690 Email Id : head.crnts@iitb.ac.in
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Mr. Amit Vitthal Kumbhar
Contact : 022-2159 6864 Email Id : aptlab@iitb.ac.in, amitkumbhar@iitb.ac.in
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